Print this page

ICP-MS Analysis of Trace Metals and Elements in Chemicals and Materials
 

Inductively Coupled Plasma Mass Spectrometry (ICP-MS) is a technique routinely used to analyse trace levels of a wide range of inorganic elements.  The ICP-MS allows for the detection and quantification of elements with atomic mass ranges 7 to 250.  This covers Lithium to Uranium.  The typical detection limits are in the parts per billion (ppb) range and even parts per trillion (ppt) in some cases.

The ICP-MS analysis methods available at LPD Lab Services allow the detection, identification and quantification of a wide array of elements using a Perkin Elmer NexION 350D ICP-MS.
 

Applications of ICP-MS

• Monitoring of trace metals and elements in drinking water, ground water, rainwater, wastewater or industrial effluent streams.
• Quantified analysis of metals and impurities collected in dusts on filter membranes and other materials.
• Trace elements in product / raw materials or from washed or rinsed surfaces.
• Analysis of additives and purity in metal alloys.
• Checking metallic species in recirculated hot and cold water system systems that may affect corrosion.
• Analysis of low level contaminants in chemical products, beverages, foods, cosmetics, pharmaceuticals.
• Analysis of soluble / leachable material from solid samples such as medical devices, polymers, PCBs.
• Fully quantitative gallium and arsenic in swabs for health and safety semiconductor plant monitoring.
• Semi-quantitative impurity checks in metalorganic precursor materials.
• Contamination checks in organic chemical product
• Low-level toxic metal screening in steels and mercury specialty alloys.
• Screening of impurities in water treatment chemicals.
• Impurity testing in Ultra-Pure process water in semiconductor raw materials production.
• Fully quantitative investigation of metals in artificial bone materials.
   

Analysis can be performed on a diverse range of sample matrices allowing accurate reliable results.
 

Please contact us if you would like more information.