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Our SEM Capability

The scanning electron microscope is an instrument used for the imaging and analysis of a wide range of materials in a wide range of applications.

SEM Instrument - Philips XL30 Scanning Electron Microscope and EDAX

www.feicompany.com

The main features and benefits of the SEM are:-

• Image magnification and resolution
• Magnification range X 15 - X 200,000
• Resolution 2 nm
• Accelerating voltage 1 - 30 keV
• Secondary and backscatter electron imaging
• Stereo imaging and stereo height measurement
• EDX analysis of known or unknown materials (www.edax.com)
• Automatic particle counting and characterisation
• Qualitative and quantitative analysis for all elements from carbon upwards
• Quantitative analysis of bulk materials and features ≥ 2 μm
• Qualitative analysis of features ≥ 0.2 μm
• Detection limits typically 0.1 - 100 Wt% for most elements
• Multi-element X-ray mapping and line scans
• Multi-layer, multi-element thin film analysis - Thickness and composition
• Particle / Phase analysis - Detection, analysis, morphology and size
• Image Analysis
• Automatic particle counting and characterisation

Links

UK Institute of Physics Electron Microscopy & Analysis Group (MAG): http://groups.iop.org/EM/
Museum of Science- How an SEM Works www.mos.org/sln/sem/intro.html